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DSpace at IIT Bombay >
Browsing by Author MANOJ, CR
Showing results 1 to 10 of 10
| Issue Date | Title | Author(s) | | 2008 | Device design and optimization considerations for bulk FinFETs | MANOJ, CR; NAGPAL, M; VARGHESE, D; RAO, VR |
| 2007 | Device optimization of bulk FinFETs and its comparison with SOI FinFETs | MANOJ, CR; MEENAKSHI, N; DHANYA, V; RAMGOPAL RAO, V |
| 2008 | Gate fringe-induced barrier lowering in underlap FinFET structures and its optimization | SACHID, AB; MANOJ, CR; SHARMA, DK; RAO, VR |
| 2010 | Impact of Fringe Capacitance on the Performance of Nanoscale FinFETs | MANOJ, CR; SACHID, AB; YUAN, F; CHANG, CY; RAO, VR |
| 2007 | Impact of high-k gate dielectrics on the device and circuit performance of nanoscale FinFETs | MANOJ, CR; RAO, VR |
| 2010 | Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs | CHABUKSWAR, S; MAJI, D; MANOJ, CR; ANIL, KG; RAO, VR; CRUPI, F; MAGNONE, P; GIUSI, G; PACE, C; COLLAERT, N |
| 2007 | Improving the DC performance of bulk FinFETs by optimum body doping | MANOJ, CR; NAGPAL, M; RAO, VR |
| 2007 | Parasitic effects in multi-gate MOSFETs | KOBAYASHI, Y; MANOJ, CR; TSUTSUI, K; HARIHARAN, V; KAKUSHIMA, K; RAO, VR; AHMET, P; IWAI, H |
| 2006 | Parasitics effects in multi gate MOSFETs | MANOJ, CR; MANGAL, A; RAO, VR; TSUTSUI, K; IWAI, H |
| 2009 | Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs | MAJI, D; CRUPI, F; AMAT, E; SIMOEN, E; DE JAEGER, B; BRUNCO, DP; MANOJ, CR; RAO, VR; MAGNONE, P; GIUSI, G; PACE, C; PANTISANO, L; MITARD, J; RODRIGUEZ, R; NAFRIA, M |
Showing results 1 to 10 of 10
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