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Browsing by Author KAPILA, G

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Issue DateTitleAuthor(s)
2008A comprehensive study of flicker noise in plasma nitrided SiON p-MOSFETs : process dependence of pre-existing and NBTI stress generated trap distribution profilesKAPILA, G; GOYAL, N; MAHETA, VD; OLSEN, C; AHMED, K; MAHAPATRA, S
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