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Issue DateTitleAuthor(s)
2009A Comparative NBTI Study of HfO(2), HfSiO(x), and SiON p-MOSFETs Using UF-OTF I(DLIN) TechniqueDEORA, S; MAHETA, VD; BERSUKER, G; OLSEN, C; AHMED, KZ; JAMMY, R; MAHAPATRA, S
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