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Browsing by Author JAIN, PALKESH

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Issue DateTitleAuthor(s)
2005SEU reliability analysis of advanced deep-submicron transistorsVASI, J; JAIN, PALKESH; LAL, RAKESH
2004Single-event-induced barrier lowering in deep-submicron MOS devices and circuitsJAIN, PALKESH; VASI, J; LAL, RAKESH
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