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DSpace at IIT Bombay >
Browsing by Author ISLAM, AE
Showing results 1 to 8 of 8
| Issue Date | Title | Author(s) | | 2009 | A Common Framework of NBTI Generation and Recovery in Plasma-Nitrided SiON p-MOSFETs | DEORA, S; MAHETA, VD; ISLAM, AE; ALAM, MA; MAHAPATRA, S |
| 2009 | Isolation of NBTI Stress Generated Interface Trap and Hole-Trapping Components in PNO p-MOSFETs | MAHAPATRA, S; MAHETA, VD; ISLAM, AE; ALAM, MA |
| 2007 | Material dependence of NBTI physical mechanism in silicon oxynitride (SiON) p-MOSFETs: A comprehensive study by ultra-fast on-the-fly (UF-OTF) I(DLIN) technique | KUMAR, EN; MAHETA, VD; PURAWAT, S; ISLAM, AE; OLSEN, C; AHMED, K; ALAM, MA; MAHAPATRA, S |
| 2009 | Material dependence of negative bias temperature instability (NBTI) stress and recovery in SiON p-MOSFETs | MAHAPATRA, S; MAHETA, VD; DEORA, S; KUMAR, EN; PURAWAT, S; OLSEN, C; AHMED, K; ISLAM, AE; ALAM, MA |
| 2008 | Mobility degradation due to interface traps in plasma oxynitride PMOS devices | ISLAM, AE; MAHETA, VD; DAS, H; MAHAPATRA, S; ALAM, MA |
| 2007 | On the physical mechanism of NBTI in silicon oxynitride p-MOSFETs: can differences in insulator processing conditions resolve the interface trap generation versus hole trapping controversy? | MAHAPATRA, S; AHMED, K; VARGHESE, D; ISLAM, AE; GUPTA, G; MADHAV, L; SAHA, D; ALAM, MA |
| 2008 | Optimization of gate leakage and NBTI for plasma-nitrided gate oxides by numerical and analytical models | ISLAM, AE; GUPTA, G; AHMED, KZ; MAHAPATRA, S; ALAM, MA |
| 2007 | Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects, and relaxation | ISLAM, AE; KUFLUOGLU, H; VARGHESE, D; MAHAPATRA, S; ALAM, MA |
Showing results 1 to 8 of 8
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