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Browsing by Author HOFMANN, R

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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
2010Applicability of dual layer metal nanocrystal flash memory for NAND 2 or 3-bit/cell operation : understanding the anomalous breakdown and optimization of P/E conditionsSINGH, P; SANDHYA, C; AULUCK, K; BISHT, G; SIVATHEJA, M; HOFMANN, R; MUKHOPADHYAY, G; MAHAPATRA, S; SINGH, PK; BISHT, KAG; SIVATHEJA, M; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R
2008Au nanocrystal flash memory reliability and failure analysisSINGH, PK; SINGH, KK; HOFMANN, R; ARMSTRONG, K; KRISHNA, N; MAHAPATRA, S
2009Dual layer Pt metal nanocrystal flash for multi-level-cell NAND applicationSINGH, PK; BISHT, G; MAHAPATRA, S; HOFMANN, R; SINGH, K
2008Metal nanocrystal memory with pt single- and dual-layer NC With low-Leakage AI2O3 Blocking DielectricSINGH, PK; BISHT, G; HOFMANN, R; SINGH, K; KRISHNA, N; MAHAPATRA, S
2009Performance and Reliability of Au and Pt Single-Layer Metal Nanocrystal Flash Memory Under NAND (FN/FN) OperationSINGH, PK; HOFMANN, R; SINGH, KK; KRISHNA, N; MAHAPATRA, S
2010Performance and Reliability Study of Single-Layer and Dual-Layer Platinum Nanocrystal Flash Memory Devices Under NAND OperationSINGH, PK; BISHT, G; AULUCK, K; SIVATHEJA, M; HOFMANN, R; SINGH, KK; MAHAPATRA, S
2009Recent advances in charge trap flash memoriesSANDHYA, C; SINGH, PK; GUPTA, S; ROHRA, H; SHIVATHEJA, M; GANGULY, U; HOFMANN, R; MUKHOPADHYAY, G; MAHAPATRA, S; VASI, J
2009Reliability of single and dual layer Pt Nanocrystal devices for NAND flash applications : a 2-region model for endurance defect generationSINGH, PK; BISHT, G; SIVATHEJA, M; SANDHYA, C; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R; SINGH, K; KRISHNA, N
Showing results 1 to 8 of 8

 

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