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Issue DateTitleAuthor(s)
20091/f Noise in Drain and Gate Current of MOSFETs With High-k Gate StacksMAGNONE, P; CRUPI, F; GIUSI, G; PACE, C; SIMOEN, E; CLAEYS, C; PANTISANO, L; MAJI, D; RAO, VR; SRINIVASAN, P
2008On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO(2)/SiO(2) gate stackMAJI, D; CRUPI, F; GIUSI, G; PACE, C; SIMOEN, E; CLAEYS, C; RAO, VR
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