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Browsing by Author BHAT, N

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Issue DateTitleAuthor(s)
2006Analytical modeling of CMOS circuit delay distribution due to concurrent variations in multiple processesHARISH, BP; BHAT, N; PATIL, MB
1992Interface-state generation under radiation and high-field stressing in reoxidized nitrided oxide MOS capacitorsVASI, J; BHAT, N
2007On a generalized framework for modeling the effects of process variations on circuit delay performance using response surface methodologyHARISH, BP; BHAT, N; PATIL, MB
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