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DSpace at IIT Bombay >
Browsing by Author BHARATH KUMAR, P
Showing results 1 to 14 of 14
| Issue Date | Title | Author(s) | | 2004 | A comprehensive trapped charge profiling technique for SONOS flash EEPROMs | NAIR, PR; BHARATH KUMAR, P; SHARMA, RAVINDER; MAHAPATRA, S; KAMOHARA, S |
| 2005 | Controlling injected electron and hole profiles for better reliability of split gate SONOS | SRIDHAR, K; BHARATH KUMAR, P; MAHAPATRA, S; MURAKAMI, E; KAMOHARA, S |
| 2007 | Dual-bit/cell SONOS flash EEPROMs: impact of channel engineering on programming speed and bit coupling effect | DATTA, A; BHARATH KUMAR, P; MAHAPATRA, S |
| 2006 | Endurance and retention characteristics of SONOS EEPROMs operated using BTBT induced hot hole erase | BHARATH KUMAR, P; MURAKAMI, E; KAMOHARA, S; MAHAPATRA, S |
| 2005 | Impact of substrate bias on p-MOSFET negative bias temperature instability | BHARATH KUMAR, P; DALEI, TR; VARGHESE, D; SAHA, D; MAHAPATRA, S; ALAM, MA |
| 2004 | Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs | MAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA |
| 2007 | Investigation of drain disturb in SONOS flash EEPROMs | BHARATH KUMAR, P; SHARMA, RAVINDER; NAIR, PR; MAHAPATRA, S |
| 2006 | Lateral profiling of trapped charge in SONOS flash EEPROMs programmed using CHE injection | MAHAPATRA, S; BHARATH KUMAR, P; NAIR, PR; SHARMA, RAVINDER; KAMOHARA, S |
| 2005 | Mechanism of drain disturb in SONOS flash EEPROMs | BHARATH KUMAR, P; SHARMA, RAVINDER; NAIR, PR; NAIR, DR; KAMOHARA, S; MAHAPATRA, S; VASI, J |
| 2004 | Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogen | MAHAPATRA, S; BHARATH KUMAR, P; DALEI, TR; SANA, D; ALAM, MA |
| 2003 | A new observation of enhanced bias temperature instability in thin gate oxide p-MOSFETs | MAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA |
| 2006 | On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress | MAHAPATRA, S; SAHA, D; VARGHESE, D; BHARATH KUMAR, P |
| 2005 | Soft secondary electron programming for floating gate NOR flash EEPROMs | BHARATH KUMAR, P; NAIR, DR; MAHAPATRA, S |
| 2006 | Using soft secondary electron programming to reduce drain disturb in floating-gate nor flash EEPROMs | MAHAPATRA, S; BHARATH KUMAR, P; NAIR, DR |
Showing results 1 to 14 of 14
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