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Browsing by Author BHARATH KUMAR, P

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Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
2004A comprehensive trapped charge profiling technique for SONOS flash EEPROMsNAIR, PR; BHARATH KUMAR, P; SHARMA, RAVINDER; MAHAPATRA, S; KAMOHARA, S
2005Controlling injected electron and hole profiles for better reliability of split gate SONOSSRIDHAR, K; BHARATH KUMAR, P; MAHAPATRA, S; MURAKAMI, E; KAMOHARA, S
2007Dual-bit/cell SONOS flash EEPROMs: impact of channel engineering on programming speed and bit coupling effectDATTA, A; BHARATH KUMAR, P; MAHAPATRA, S
2006Endurance and retention characteristics of SONOS EEPROMs operated using BTBT induced hot hole eraseBHARATH KUMAR, P; MURAKAMI, E; KAMOHARA, S; MAHAPATRA, S
2005Impact of substrate bias on p-MOSFET negative bias temperature instabilityBHARATH KUMAR, P; DALEI, TR; VARGHESE, D; SAHA, D; MAHAPATRA, S; ALAM, MA
2004Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETsMAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA
2007Investigation of drain disturb in SONOS flash EEPROMsBHARATH KUMAR, P; SHARMA, RAVINDER; NAIR, PR; MAHAPATRA, S
2006Lateral profiling of trapped charge in SONOS flash EEPROMs programmed using CHE injectionMAHAPATRA, S; BHARATH KUMAR, P; NAIR, PR; SHARMA, RAVINDER; KAMOHARA, S
2005Mechanism of drain disturb in SONOS flash EEPROMsBHARATH KUMAR, P; SHARMA, RAVINDER; NAIR, PR; NAIR, DR; KAMOHARA, S; MAHAPATRA, S; VASI, J
2004Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogenMAHAPATRA, S; BHARATH KUMAR, P; DALEI, TR; SANA, D; ALAM, MA
2003A new observation of enhanced bias temperature instability in thin gate oxide p-MOSFETsMAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA
2006On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stressMAHAPATRA, S; SAHA, D; VARGHESE, D; BHARATH KUMAR, P
2005Soft secondary electron programming for floating gate NOR flash EEPROMsBHARATH KUMAR, P; NAIR, DR; MAHAPATRA, S
2006Using soft secondary electron programming to reduce drain disturb in floating-gate nor flash EEPROMsMAHAPATRA, S; BHARATH KUMAR, P; NAIR, DR
Showing results 1 to 14 of 14

 

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