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DSpace at IIT Bombay >
Browsing by Author ALAM, MA
Showing results 1 to 20 of 22
| Issue Date | Title | Author(s) | | 2003 | Cold springs of the Barren Island, Andaman Sea, Indian Ocean | CHANDRASEKHARAM, D; VASELLI, O; CAPACCIONI, B; MANETTI, P; ALAM, MA |
| 2010 | Comment on "thermoluminescence and optically stimulated luminescence signals from volcanic ash: history of volcanism in barren island, andaman sea" by d. Banerjee (quaternary geochronology) | ALAM, MA; CHANDRASEKHARAM, D |
| 2009 | A Common Framework of NBTI Generation and Recovery in Plasma-Nitrided SiON p-MOSFETs | DEORA, S; MAHETA, VD; ISLAM, AE; ALAM, MA; MAHAPATRA, S |
| 2007 | A comprehensive model for PMOS NBTI degradation: Recent progress | ALAM, MA; KUFLUOGLU, H; VARGHESE, D; MAHAPATRA, S |
| 2005 | A comprehensive model of PMOS NBTI degradation | ALAM, MA; MAHAPATRA, S |
| 2008 | Defect generation in p-MOSFETs under negative-bias stress: an experimental perspective | MAHAPATRA, S; ALAM, MA |
| 2005 | Hole energy dependent interface trap generation in MOSFET Si/SiO2 interface | MAHAPATRA, S; VARGHESE, D; ALAM, MA |
| 2005 | Impact of substrate bias on p-MOSFET negative bias temperature instability | BHARATH KUMAR, P; DALEI, TR; VARGHESE, D; SAHA, D; MAHAPATRA, S; ALAM, MA |
| 2004 | Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs | MAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA |
| 2009 | Isolation of NBTI Stress Generated Interface Trap and Hole-Trapping Components in PNO p-MOSFETs | MAHAPATRA, S; MAHETA, VD; ISLAM, AE; ALAM, MA |
| 2007 | Material dependence of NBTI physical mechanism in silicon oxynitride (SiON) p-MOSFETs: A comprehensive study by ultra-fast on-the-fly (UF-OTF) I(DLIN) technique | KUMAR, EN; MAHETA, VD; PURAWAT, S; ISLAM, AE; OLSEN, C; AHMED, K; ALAM, MA; MAHAPATRA, S |
| 2009 | Material dependence of negative bias temperature instability (NBTI) stress and recovery in SiON p-MOSFETs | MAHAPATRA, S; MAHETA, VD; DEORA, S; KUMAR, EN; PURAWAT, S; OLSEN, C; AHMED, K; ISLAM, AE; ALAM, MA |
| 2004 | Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogen | MAHAPATRA, S; BHARATH KUMAR, P; DALEI, TR; SANA, D; ALAM, MA |
| 2008 | Mobility degradation due to interface traps in plasma oxynitride PMOS devices | ISLAM, AE; MAHETA, VD; DAS, H; MAHAPATRA, S; ALAM, MA |
| 2003 | A new observation of enhanced bias temperature instability in thin gate oxide p-MOSFETs | MAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA |
| 2010 | On the Nature of Shunt Leakage in Amorphous Silicon p-i-n Solar Cells | DONGAONKAR, S; KARTHIK, Y; WANG, DP; FREI, M; MAHAPATRA, S; ALAM, MA |
| 2007 | On the physical mechanism of NBTI in silicon oxynitride p-MOSFETs: can differences in insulator processing conditions resolve the interface trap generation versus hole trapping controversy? | MAHAPATRA, S; AHMED, K; VARGHESE, D; ISLAM, AE; GUPTA, G; MADHAV, L; SAHA, D; ALAM, MA |
| 2008 | Optimization of gate leakage and NBTI for plasma-nitrided gate oxides by numerical and analytical models | ISLAM, AE; GUPTA, G; AHMED, KZ; MAHAPATRA, S; ALAM, MA |
| 2004 | Petrology of the prehistoric lavas and dyke of the Barren Island, Andaman Sea, Indian ocean | ALAM, MA; CHANDRASEKHARAM, D; VASELLI, O; CAPACCIONI, B; MANETTI, P; SANTO, PB |
| 2002 | A predictive reliability model for PMOS bias temperature degradation | MAHAPATRA, S; ALAM, MA |
Showing results 1 to 20 of 22
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