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Browsing by Author AHMED, KZ
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| Issue Date | Title | Author(s) | | 2009 | A Comparative NBTI Study of HfO(2), HfSiO(x), and SiON p-MOSFETs Using UF-OTF I(DLIN) Technique | DEORA, S; MAHETA, VD; BERSUKER, G; OLSEN, C; AHMED, KZ; JAMMY, R; MAHAPATRA, S |
| 2008 | Optimization of gate leakage and NBTI for plasma-nitrided gate oxides by numerical and analytical models | ISLAM, AE; GUPTA, G; AHMED, KZ; MAHAPATRA, S; ALAM, MA |
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