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Browsing by Author YEO, CHIA CHING
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2007
Border-trap characterization in high-κ strained-Si MOSFETs
MAJI, DEBABRATA
;
DUTTAGUPTA, SP
;
RAMGOPAL RAO, V
;
YEO, CHIA CHING
;
CHO, BYUNG-JIN
Showing results 1 to 1 of 1
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