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Browsing by Author VISWANATHAN, CR

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Issue DateTitleAuthor(s)
2000Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETsMAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J
1999A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETsMAHAPATRA, S; PARIKH, CD; VASI, J; RAMGOPAL RAO, V; VISWANATHAN, CR
1998Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETsRAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR
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