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Issue Date	Title	Author(s)
2000	Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs	MAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J
1999	A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs	MAHAPATRA, S; PARIKH, CD; VASI, J; RAMGOPAL RAO, V; VISWANATHAN, CR
1998	Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs	RAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR

Showing results 3 to 5 of 5