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DSpace at IIT Bombay >
Browsing by Author VISWANATHAN, CR
Showing results 1 to 5 of 5
| Issue Date | Title | Author(s) | | 1998 | Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices | BROZEK, T; RAMGOPAL RAO, V; SRIDHARAN, A; WERKING, JD; CHAN, YD; VISWANATHAN, CR |
| 2000 | A comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique | MAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J |
| 2000 | Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs | MAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J |
| 1999 | A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs | MAHAPATRA, S; PARIKH, CD; VASI, J; RAMGOPAL RAO, V; VISWANATHAN, CR |
| 1998 | Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs | RAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR |
Showing results 1 to 5 of 5
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