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Browsing by Author VAIDYA, SJ

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Issue DateTitleAuthor(s)
2002Neutron induced degradation in nitrided pyrogenic field oxide MOS capacitorsVAIDYA, SJ; SHARMA, DK; SHAIKH, AM; CHANDORKAR, AN
2002Neutron induced ionization damage in MOS capacitor and MOSFET structuresVAIDYA, SJ; SHARMA, DK; CHANDORKAR, AN
2003Neutron induced oxide degradation in MOSFET structuresSHARMA, DK; CHANDORKAR, AN; VAIDYA, SJ
2002Study of SILC and interface trap generation due to high field stressing and its operating temperature dependence in 2.2 nm gate dielectricsCHANDORKAR, AN; BORSE, DG; VAIDYA, SJ
Showing results 1 to 4 of 4

 

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