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DSpace at IIT Bombay >
Browsing by Author VAIDYA, SJ
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) | | 2002 | Neutron induced degradation in nitrided pyrogenic field oxide MOS capacitors | VAIDYA, SJ; SHARMA, DK; SHAIKH, AM; CHANDORKAR, AN |
| 2002 | Neutron induced ionization damage in MOS capacitor and MOSFET structures | VAIDYA, SJ; SHARMA, DK; CHANDORKAR, AN |
| 2003 | Neutron induced oxide degradation in MOSFET structures | SHARMA, DK; CHANDORKAR, AN; VAIDYA, SJ |
| 2002 | Study of SILC and interface trap generation due to high field stressing and its operating temperature dependence in 2.2 nm gate dielectrics | CHANDORKAR, AN; BORSE, DG; VAIDYA, SJ |
Showing results 1 to 4 of 4
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