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Issue DateTitleAuthor(s)
1995IONIC PENETRATION INTO REOXIDIZED NITRIDED OXIDES IN ELECTROLYTE-OXIDE-SEMICONDUCTOR STRUCTURESTOPKAR, A; LAL, R
2000Ionizing-radiation induced degradation of SiGeHBTsTOPKAR, A; LODHA, S; MAHFOOZ, AT; VASI, J; LAL, R; NANVER, L
1998Radiation-induced degradation of bipolar transistorsTOPKAR, A; MATHEW, T; LAL, R; VASI, J; NANVER, L
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