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Issue DateTitleAuthor(s)
2009Recent advances in charge trap flash memoriesSANDHYA, C; SINGH, PK; GUPTA, S; ROHRA, H; SHIVATHEJA, M; GANGULY, U; HOFMANN, R; MUKHOPADHYAY, G; MAHAPATRA, S; VASI, J
2009Reliability of single and dual layer Pt Nanocrystal devices for NAND flash applications : a 2-region model for endurance defect generationSINGH, PK; BISHT, G; SIVATHEJA, M; SANDHYA, C; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R; SINGH, K; KRISHNA, N
2010Tri-Level Resistive Switching in Metal-Nanocrystal-Based Al(2)O(3)/SiO(2) Gate StackCHEN, YN; PEY, KL; GOH, KEJ; LWIN, ZZ; SINGH, PK; MAHAPATRA, S
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