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Issue DateTitleAuthor(s)
2008Nitride engineering and the effect of interfaces on charge trap flash performance and reliabilitySANDHYA, C; GANGULY, U; SINGH, KK; SINGH, PK; OLSEN, C; SEUTTER, SM; HUNG, R; CONTI, G; AHMED, K; KRISHNA, N; VASI, J; MAHAPATRA, S
2007Partial crystallization of HfO2 for Two-Bit/Four-Level SONOS-Type flash memoryZHANG, G; SAMANTA, SK; SINGH, PK; MA, FJ; YOO, MT; ROH, Y; YOO, WJ
2009Performance and Reliability of Au and Pt Single-Layer Metal Nanocrystal Flash Memory Under NAND (FN/FN) OperationSINGH, PK; HOFMANN, R; SINGH, KK; KRISHNA, N; MAHAPATRA, S
2010Performance and Reliability Study of Single-Layer and Dual-Layer Platinum Nanocrystal Flash Memory Devices Under NAND OperationSINGH, PK; BISHT, G; AULUCK, K; SIVATHEJA, M; HOFMANN, R; SINGH, KK; MAHAPATRA, S
2009Recent advances in charge trap flash memoriesSANDHYA, C; SINGH, PK; GUPTA, S; ROHRA, H; SHIVATHEJA, M; GANGULY, U; HOFMANN, R; MUKHOPADHYAY, G; MAHAPATRA, S; VASI, J
2009Reliability of single and dual layer Pt Nanocrystal devices for NAND flash applications : a 2-region model for endurance defect generationSINGH, PK; BISHT, G; SIVATHEJA, M; SANDHYA, C; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R; SINGH, K; KRISHNA, N
2010Tri-Level Resistive Switching in Metal-Nanocrystal-Based Al(2)O(3)/SiO(2) Gate StackCHEN, YN; PEY, KL; GOH, KEJ; LWIN, ZZ; SINGH, PK; MAHAPATRA, S
Showing results 9 to 15 of 15
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