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Issue DateTitleAuthor(s)
2013Part II: Investigation of Subthreshold Swing in Line Tunnel FETs Using Bias Stress MeasurementsWALKE, AM; VANDOOREN, A; KACZER, B; VERHULST, AS; ROOYACKERS, R; SIMOEN, E; HEYNS, MM; RAO, VR; GROESENEKEN, G; COLLAERT, N; THEAN, AVY
2013Part I: Impact of Field-Induced Quantum Confinement on the Subthreshold Swing Behavior of Line TFETsWALKE, AM; VERHULST, AS; VANDOOREN, A; VERRECK, D; SIMOEN, E; RAO, VR; GROESENEKEN, G; COLLAERT, N; THEAN, AVY
2009Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETsMAJI, D; CRUPI, F; AMAT, E; SIMOEN, E; DE JAEGER, B; BRUNCO, DP; MANOJ, CR; RAO, VR; MAGNONE, P; GIUSI, G; PACE, C; PANTISANO, L; MITARD, J; RODRIGUEZ, R; NAFRIA, M
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