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Browsing by Author SHUKURI, S

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Showing results 1 to 15 of 15
Issue DateTitleAuthor(s)
2002CHISEL flash EEPROM - Part II: ReliabilityMAHAPATRA, S; SHUKURI, S; BUDE, J
2002CHISEL flash EEPROM - Part I: Performance and scalingMAHAPATRA, S; SHUKURI, S; BUDE, J
2003CHISEL programming operation of scaled NOR flash EEPROMs - Effect of voltage scaling, device scaling and technological parametersMOHAPATRA, NR; NAIR, DR; MAHAPATRA, S; RAO, VR; SHUKURI, S; BUDE, JD
2003CHISEL programming operation of scaled NOR flash EEPROMs-effect of voltage scaling, device scaling and technological parametersMAHAPATRA, S; MOHAPATRA, NR; NAIR, DR; RAMGOPAL RAO, V; SHUKURI, S; BUDE, JD
2004Cycling endurance of NOR flash EEPROM cells under CHISEL programming operation - impact of technological parameters and scalingNAIR, DR; SHUKURI, S; MAHAPATRA, S
2004Drain disturb during CHISEL programming of NOR flash EEPROMs-physical mechanisms and impact of technological parametersMAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD
2003The effect of CHE and CHISEL programming operation on drain disturb in flash EEPROMsNAIR, DR; MOHAPATRA, NR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2004Effect of P/E cycling on drain disturb in flash EEPROMs under CHE and CHISEL operationMAHAPATRA, S; NAIR, DR; MOHAPATRA, NR; SHUKURI, S; BUDE, JD
2003Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMsMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S; BUDE, JD
2005Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operationNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2005Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operationMAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD
2003The impact of channel engineering on the performance reliability and scaling of CHISEL NOR flash EEPROMsMOHAPATRA, NR; NAIR, DR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S
2004Multi-level programming of NOR flash EEPROMs by CHISEL mechanismNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2002Performance and reliability of high density flash EEPROMs under CHISEL programming operationMAHAPATRA, S; SHUKURI, S; BUDE, JD
2003Substrate bias effect on cycling induced performance degradation of flash EEPROMsMAHAPATRA, S; SHUKURI, S; BUDE, JD
Showing results 1 to 15 of 15

 

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