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Browsing by Author RAMGOPAL RAO, V

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Issue DateTitleAuthor(s)
2003Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressingMANJULA RANI, KN; RAMGOPAL RAO, V; VASI, J
2000Reliability studies on sub 100 nm SOI-MNSFETsMAHAPATRA, S; RAMGOPAL RAO, V; VASI, J; CHENG, B; WOO, JCS
2007Silanization and antibody immobilization on SU-8JOSHI, M; PINTO, RICHARD; RAMGOPAL RAO, V; MUKHERJI, SOUMYA
2004Silicon film thickness optimization for SOI-DTMOS from circuit performance considerationsDESAI, MP; ANAND, B; RAMGOPAL RAO, V
2007A simple and direct method for interface characterization of OFETsSRINIVAS, P; TIWARI, SP; RAVAL, HN; RAMESH, RN; CAHYADI, T; MHAISALKAR, SG; RAMGOPAL RAO, V
1997Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETsRAMGOPAL RAO, V; HANSCH, W; EISELE, I
2003Small signal characteristics of thin film single halo SOI MOSFET for mixed mode applicationsNAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; VASI, J
2007Solution-processed n-type organic field-effect transistors with high ON/ OFF current ratios based on fullerene derivativesTIWARI, SP; NAMDAS, EB; RAMGOPAL RAO, V
2004Stress voltage polarity dependence of JVD-Si3N4 MNSFET degradationVASI, J; MANJULA RANI, KN; RAMGOPAL RAO, V
2002The study of damage generation in n-channel MOS transistors operating in the substrate enhanced gate current regimeMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V
2001Study of degradation in channel initiated secondary electron injection regimeMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V
2004Sub-threshold swing degradation due to localized charge storage in SONOS memoriesTOMAR, BHAWNA; RAMGOPAL RAO, V
2005Superior hot carrier reliability of single halo (SH) silicon-on-insulator (SOI) nMOSFET in analog applicationsVASI, J; NAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; WOO, JCS
2002Suppression of boron penetration by hot wire CVD polysiliconVAIRAGAR, AV; PATIL, SAMADHAN B; PETE, DJ; WAGHMARE, PARAG C; DUSANE, RO; VENKATRAMANI, N; RAMGOPAL RAO, V
2003Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applicationsNAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; VASI, J
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