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DSpace at IIT Bombay >
Browsing by Author RAMGOPAL RAO, V
Showing results 46 to 65 of 70
| Issue Date | Title | Author(s) | | 2007 | Patterned microfluidic channels using self-assembled hydroxy-phenyl porphyrin monolayer | NAYAK, K; KULKARNI, PD; DEEPU, A; SITARAMAN, VR; PUNIDHA, SOUMYA; SAHA, AA; RAVIKANTH, M; MITRA, SK; MUKHERJI, S; RAMGOPAL RAO, V |
| 2007 | Pentacene organic field effect transistors on flexible substrates with polymer dielectrics | TIWARI, SP; RAMGOPAL RAO, V; HUEI SHAUN TAN; NAMDAS, EB; MHAISALKAR, SG |
| 2001 | Performance and hot-carrier reliability of 100 nm channel length jet vapor deposited Si3N4 MNSFETs | MAHAPATRA, S; RAMGOPAL RAO, V; CHENG, B; KHARE, M; PARIKH, CD; WOO, JCS; VASI, J |
| 2002 | Performance and reliability of single halo deep sub-micron p-MOSFETs for analog applications | JHA, NK; BAGHINI, MS; RAMGOPAL RAO, V |
| 2005 | Performance of channel engineered SDODEL MOSFET for mixed signal applications | SARKAR, P; MALLIK, A; SARKAR, CK; RAMGOPAL RAO, V |
| 2001 | Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering | SHRIVASTAV, G; MAHAPATRA, S; RAMGOPAL RAO, V; VASI, J |
| 2008 | Photoplastic NEMS with an encapsulated polysilicon piezoresistor | KALE, NS; NAG, S; PINTO, RICHARD; RAMGOPAL RAO, V |
| 2002 | Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs | MUTHA, YATIN M; LAL, RAKESH; RAMGOPAL RAO, V |
| 1998 | Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs | RAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR |
| 2005 | Power-area evaluation of various double-gate RF mixer topologies | PATIL, MB; REDDY, MVR; SHARMA, DK; RAMGOPAL RAO, V |
| 2003 | Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing | MANJULA RANI, KN; RAMGOPAL RAO, V; VASI, J |
| 2000 | Reliability studies on sub 100 nm SOI-MNSFETs | MAHAPATRA, S; RAMGOPAL RAO, V; VASI, J; CHENG, B; WOO, JCS |
| 2007 | Silanization and antibody immobilization on SU-8 | JOSHI, M; PINTO, RICHARD; RAMGOPAL RAO, V; MUKHERJI, SOUMYA |
| 2004 | Silicon film thickness optimization for SOI-DTMOS from circuit performance considerations | DESAI, MP; ANAND, B; RAMGOPAL RAO, V |
| 2007 | A simple and direct method for interface characterization of OFETs | SRINIVAS, P; TIWARI, SP; RAVAL, HN; RAMESH, RN; CAHYADI, T; MHAISALKAR, SG; RAMGOPAL RAO, V |
| 1997 | Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs | RAMGOPAL RAO, V; HANSCH, W; EISELE, I |
| 2003 | Small signal characteristics of thin film single halo SOI MOSFET for mixed mode applications | NAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; VASI, J |
| 2007 | Solution-processed n-type organic field-effect transistors with high ON/ OFF current ratios based on fullerene derivatives | TIWARI, SP; NAMDAS, EB; RAMGOPAL RAO, V |
| 2004 | Stress voltage polarity dependence of JVD-Si3N4 MNSFET degradation | VASI, J; MANJULA RANI, KN; RAMGOPAL RAO, V |
| 2002 | The study of damage generation in n-channel MOS transistors operating in the substrate enhanced gate current regime | MOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V |
Showing results 46 to 65 of 70
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