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DSpace at IIT Bombay >
Browsing by Author RAMGOPAL RAO, V
Showing results 56 to 70 of 70
| Issue Date | Title | Author(s) | | 2003 | Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing | MANJULA RANI, KN; RAMGOPAL RAO, V; VASI, J |
| 2000 | Reliability studies on sub 100 nm SOI-MNSFETs | MAHAPATRA, S; RAMGOPAL RAO, V; VASI, J; CHENG, B; WOO, JCS |
| 2007 | Silanization and antibody immobilization on SU-8 | JOSHI, M; PINTO, RICHARD; RAMGOPAL RAO, V; MUKHERJI, SOUMYA |
| 2004 | Silicon film thickness optimization for SOI-DTMOS from circuit performance considerations | DESAI, MP; ANAND, B; RAMGOPAL RAO, V |
| 2007 | A simple and direct method for interface characterization of OFETs | SRINIVAS, P; TIWARI, SP; RAVAL, HN; RAMESH, RN; CAHYADI, T; MHAISALKAR, SG; RAMGOPAL RAO, V |
| 1997 | Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs | RAMGOPAL RAO, V; HANSCH, W; EISELE, I |
| 2003 | Small signal characteristics of thin film single halo SOI MOSFET for mixed mode applications | NAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; VASI, J |
| 2007 | Solution-processed n-type organic field-effect transistors with high ON/ OFF current ratios based on fullerene derivatives | TIWARI, SP; NAMDAS, EB; RAMGOPAL RAO, V |
| 2004 | Stress voltage polarity dependence of JVD-Si3N4 MNSFET degradation | VASI, J; MANJULA RANI, KN; RAMGOPAL RAO, V |
| 2002 | The study of damage generation in n-channel MOS transistors operating in the substrate enhanced gate current regime | MOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V |
| 2001 | Study of degradation in channel initiated secondary electron injection regime | MOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V |
| 2004 | Sub-threshold swing degradation due to localized charge storage in SONOS memories | TOMAR, BHAWNA; RAMGOPAL RAO, V |
| 2005 | Superior hot carrier reliability of single halo (SH) silicon-on-insulator (SOI) nMOSFET in analog applications | VASI, J; NAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; WOO, JCS |
| 2002 | Suppression of boron penetration by hot wire CVD polysilicon | VAIRAGAR, AV; PATIL, SAMADHAN B; PETE, DJ; WAGHMARE, PARAG C; DUSANE, RO; VENKATRAMANI, N; RAMGOPAL RAO, V |
| 2003 | Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications | NAJEEB-UD-DIN HAKIM; RAMGOPAL RAO, V; VASI, J |
Showing results 56 to 70 of 70
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