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Browsing by Author RAMGOPAL RAO, V

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Issue DateTitleAuthor(s)
2005NBTI degradation and its impact for analog circuit reliabilityRAMGOPAL RAO, V; JHA, NEERAJ K; REDDY, PS; SHARMA, DK
1996Neutral electron trap generation under irradiation in reoxidized nitrided gate dielectricsRAMGOPAL RAO, V; SHARMA, DK; VASI, J
2005A new drain voltage enhanced NBTI degradation mechanismJHA, NEERAJ K; REDDY, PS; RAMGOPAL RAO, V
2003A new method to characterize border traps in submicron transistors using hysteresis in the drain currentRAMGOPAL RAO, V; MANJULA RANI, KN; VASI, J
2003Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologiesWAGHMARE, PARAG C; PATIL, SAMADHAN B; KUMBHAR, ALKA A; RAMGOPAL RAO, V; DUSANE, RO
2008A Novel and robust approach for common mode feedback using IDDG FinFETSHRIVASTAVA, MAYANK; BAGHINI, MS; SACHID, AB; SHARMA, DK; RAMGOPAL RAO, V
2007A novel dry method for surface modification of SU-8 for immobilization of biomolecules in Bio-MEMSJOSHI, M; KALE, NITIN; LAL, RAKESH; RAMGOPAL RAO, V; MUKHERJI, SOUMYA
2003A novel dynamic threshold operation using electrically induced junction MOSFET in the deep sub-micrometer CMOS regimeDIXIT, ABHISEK; RAMGOPAL RAO, V
2002Optimization and realization of sub-100-nm channel length single halo p-MOSFETsRAMGOPAL RAO, V; BORSE, DG; MANJULA RANI, KN; JHA, NEERAJ K; CHANDORKAR, AN; VASI, J; CHENG, B; WOO, JCS
2002Optimization of single halo p-MOSFET implant parameters for improved analog performance and reliabilityJHA, NK; RAMGOPAL RAO, V; WOO, JCS
2007Patterned microfluidic channels using self-assembled hydroxy-phenyl porphyrin monolayerNAYAK, K; KULKARNI, PD; DEEPU, A; SITARAMAN, VR; PUNIDHA, SOUMYA; SAHA, AA; RAVIKANTH, M; MITRA, SK; MUKHERJI, S; RAMGOPAL RAO, V
2007Pentacene organic field effect transistors on flexible substrates with polymer dielectricsTIWARI, SP; RAMGOPAL RAO, V; HUEI SHAUN TAN; NAMDAS, EB; MHAISALKAR, SG
2001Performance and hot-carrier reliability of 100 nm channel length jet vapor deposited Si3N4 MNSFETsMAHAPATRA, S; RAMGOPAL RAO, V; CHENG, B; KHARE, M; PARIKH, CD; WOO, JCS; VASI, J
2002Performance and reliability of single halo deep sub-micron p-MOSFETs for analog applicationsJHA, NK; BAGHINI, MS; RAMGOPAL RAO, V
2005Performance of channel engineered SDODEL MOSFET for mixed signal applicationsSARKAR, P; MALLIK, A; SARKAR, CK; RAMGOPAL RAO, V
2001Performance optimization of 60 nm channel length vertical MOSFETs using channel engineeringSHRIVASTAV, G; MAHAPATRA, S; RAMGOPAL RAO, V; VASI, J
2008Photoplastic NEMS with an encapsulated polysilicon piezoresistorKALE, NS; NAG, S; PINTO, RICHARD; RAMGOPAL RAO, V
2002Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETsMUTHA, YATIN M; LAL, RAKESH; RAMGOPAL RAO, V
1998Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETsRAMGOPAL RAO, V; WIJERATNE, G; CHU, D; BROZEK, T; VISWANATHAN, CR
2005Power-area evaluation of various double-gate RF mixer topologiesPATIL, MB; REDDY, MVR; SHARMA, DK; RAMGOPAL RAO, V
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