Browsing by Author RAMGOPAL RAO, V

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 21 to 40 of 70 < previous   next >
Issue DateTitleAuthor(s)
2002The effect of high-K gate dielectrics on deep submicrometer CMOS device and circuit performanceDESAI, MP; MOHAPATRA, NR; NARENDRA, SG; RAMGOPAL RAO, V
2004The effect of LAC doping on deep submicrometer transistor capacitances and its influence on device RF performanceDESAI, MP; NARASIMHULU, K; NARENDRA, SG; RAMGOPAL RAO, V
2003Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMsMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S; BUDE, JD
2006The effects of varying tilt angle of halo implant on the performance of sub 100nm LAC MOSFETsSARKAR, P; MALLIK, A; SARKAR, CK; RAMGOPAL RAO, V
2005Evaluation of the impact of layout on device and analog circuit performance with lateral asymmetric channel MOSFETsPATIL, MB; VINAY KUMAR, D; NARASIMHULU, K; REDDY, PS; BAGHINI, MS; SHARMA, DK; RAMGOPAL RAO, V
2009Fabrication and characterization of a polymeric microcantilever with an encapsulated hotwire CVD polysilicon piezoresistorKALE, NS; NAG, S; PINTO, RICHARD; RAMGOPAL RAO, V
2005Forward body-biased single halo MOS devices for low voltage analog circuitsNARASIMHULU, K; RAMGOPAL RAO, V
1997High-field stressing of LPCVD gate oxidesRAMGOPAL RAO, V; EISELE, I; PATRIKAR, RM; SHARMA, DK; GRABOLLA, T; VASI, J
2003Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devicesPATIL, SAMADHAN B; VAIRAGAR, ANAND V; KUMBHAR, ALKA A; SAHU, LAXMI; RAMGOPAL RAO, V; VENKATRAMANI, N; DUSANE, RO; SCHROEDER, B
1999Hot-carrier induced interface degradation in jet vapor deposited SiN MNSFETs as studied by a novel charge pumping techniqueMAHAPATRA, S; RAMGOPAL RAO, V; PARIKH, CD; VASI, J; CHENG, B; KHARE, M; WOO, JCS
2003The impact of channel engineering on the performance reliability and scaling of CHISEL NOR flash EEPROMsMOHAPATRA, NR; NAIR, DR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S
2003Impact of lateral asymmetric channel doping on deep submicrometer mixed-signal device and circuit performanceSHARMA, DK; NARASIMHULU, K; RAMGOPAL RAO, V
1999Low temperature-high pressure grown thin gate dielectrics for MOS applicationsRAMGOPAL RAO, V; MAHAPATRA, S; SHARMA, DK; VASI, J; GRABOLLA, T; EISELE, I; HANSCH, W
2005A meso-pyridyl porphyrin self-assembled monolayer on gold substrates for molecular electronics applicationsSATHYAPALAN, AMARCHAND; LOHANI, ANUP; SANTRA, SANGITA; RAVIKANTH, M; MUKHERJI, SOUMYO; RAMGOPAL RAO, V
2008Metallated porphyrin self assembled monolayers as Cu diffusion barriers for the nano-sale CMOS technologiesKHADERBAD, MA; NAYAK, K; YEDUKONDALU, M; RAVIKANTH, M; MUKHERJI, SOUMYA; RAMGOPAL RAO, V
2005NBTI degradation and its impact for analog circuit reliabilityRAMGOPAL RAO, V; JHA, NEERAJ K; REDDY, PS; SHARMA, DK
1996Neutral electron trap generation under irradiation in reoxidized nitrided gate dielectricsRAMGOPAL RAO, V; SHARMA, DK; VASI, J
2005A new drain voltage enhanced NBTI degradation mechanismJHA, NEERAJ K; REDDY, PS; RAMGOPAL RAO, V
2003A new method to characterize border traps in submicron transistors using hysteresis in the drain currentRAMGOPAL RAO, V; MANJULA RANI, KN; VASI, J
2003Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologiesWAGHMARE, PARAG C; PATIL, SAMADHAN B; KUMBHAR, ALKA A; RAMGOPAL RAO, V; DUSANE, RO