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Browsing by Author PATRIKAR, RM
Showing results 4 to 9 of 9
| Issue Date | Title | Author(s) | | 1993 | HIGH-FIELD CHARACTERISTICS OF METAL-OXIDE-SEMICONDUCTOR CAPACITORS WITH THE SILICON IN INVERSION | PATRIKAR, RM; LAL, R; VASI, J |
| 1997 | High-field stressing of LPCVD gate oxides | RAMGOPAL RAO, V; EISELE, I; PATRIKAR, RM; SHARMA, DK; GRABOLLA, T; VASI, J |
| 1995 | INTERFACE STATE GENERATION DUE TO HIGH-FIELD STRESSING IN MOS OXIDES | PATRIKAR, RM; LAL, R; VASI, J |
| 1993 | Net positive-charge buildup in various MOS insulators due to high-field stressing | VASI, J; PATRIKAR, RM; LAL, RAKESH |
| 1992 | NEW METHOD FOR ASSESSING DIELECTRIC INTEGRITY OF MOS OXIDES | PATRIKAR, RM; LAL, R |
| 1993 | POWER LAW MODEL FOR POSITIVE CHARGE BUILDUP IN SILICON DIOXIDE DUE TO HIGH-FIELD STRESSING | PATRIKAR, RM; LAL, R; VASI, J |
Showing results 4 to 9 of 9
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