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Browsing by Author PARIKH, CD

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Issue DateTitleAuthor(s)
2002Breakdown voltage and on resistance of super-junction power MOSFET : CoolMOS (TM)KONDEKAR, PN; PATIL, MB; PARIKH, CD
1999A compact model for the N-well resistorPARIKH, CD; PATRIKAR, RM
2000A comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping techniqueMAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J
2000Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETsMAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J
1999A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETsMAHAPATRA, S; PARIKH, CD; VASI, J; RAMGOPAL RAO, V; VISWANATHAN, CR
1999Hot-carrier induced interface degradation in jet vapor deposited SiN MNSFETs as studied by a novel charge pumping techniqueMAHAPATRA, S; RAMGOPAL RAO, V; PARIKH, CD; VASI, J; CHENG, B; KHARE, M; WOO, JCS
1998A large signal non-quasistatic model for short-channel MOSFET'sSAILAJA, Y; PARIKH, CD
1987MODELING OF A DEPLETION-MODE MOSFETPARIKH, CD; VASI, J
1988Modeling of a depletion-mode mosfet - responsePARIKH, CD; VASI, J
2002Modeling of the CoolMOSTM transistor - Part I: device physicsPATIL, MB; DANIEL, BJ; PARIKH, CD
2002Modeling of the CoolMOSTM transistor - Part II: DC model and parameter extractionPATIL, MB; DANIEL, BJ; PARIKH, CD
1999A new "multifrequency" charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET'sMAHAPATRA, S; PARIKH, CD; VASI, J
1999A new “multifrequency” charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET'sMAHAPATRA, S; PARIKH, CD; VASI, J
1998A new quasi-static model for short-channel MOSFETsDAMLE, P; PARIKH, CD
1998A new technique to profile hot-carrier induced interface state generation in nMOSFETs using charge pumpingMAHAPATRA, S; PARIKH, CD; VASI, J
2001Performance and hot-carrier reliability of 100 nm channel length jet vapor deposited Si3N4 MNSFETsMAHAPATRA, S; RAMGOPAL RAO, V; CHENG, B; KHARE, M; PARIKH, CD; WOO, JCS; VASI, J
1996RADSPICE: A circuit simulator to predict the effects of radiationCHUMBER, HK; KALAVADE, PP; PARIKH, CD; DAS, A
1999A study of 100 nm channel length asymmetric channel MOSFET by using charge pumpingMAHAPATRA, S; RAO, VR; PARIKH, CD; VASI, J; CHENG, B; WOO, JCS
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