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Browsing by Author PARIKH, CD
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Issue Date  Title  Author(s)  2002  Analysis and design of superjunction power MOSFET: CoolMOS™ for improved on resistance and breakdown voltage using theory of novel voltage sustaining layer  KONDEKAR, PN; PATIL, MB; PARIKH, CD 
2002  Analysis of breakdown voltage and on resistance of super junction power MOSFET CoolMOSTM using theory of novel voltage sustaining layer  KONDEKAR, PN; PARIKH, CD; PATIL, MB 
2002  Analytical design methodology of a novel driftlayer for superjunction power MOSFET: CoolMOS (TM)  KONDEKAR, PN; PATIL, MB; PARIKH, CD 
2002  Breakdown voltage and on resistance of superjunction power MOSFET : CoolMOS (TM)  KONDEKAR, PN; PATIL, MB; PARIKH, CD 
1999  A compact model for the Nwell resistor  PARIKH, CD; PATRIKAR, RM 
2000  A comprehensive study of hotcarrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique  MAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J 
2000  Device scaling effects on hotcarrier induced interface and oxidetrapped charge distributions in MOSFETs  MAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J 
1999  A direct charge pumping technique for spatial profiling of hotcarrier induced interface and oxide traps in MOSFETs  MAHAPATRA, S; PARIKH, CD; VASI, J; RAMGOPAL RAO, V; VISWANATHAN, CR 
1999  Hotcarrier induced interface degradation in jet vapor deposited SiN MNSFETs as studied by a novel charge pumping technique  MAHAPATRA, S; RAMGOPAL RAO, V; PARIKH, CD; VASI, J; CHENG, B; KHARE, M; WOO, JCS 
1998  A large signal nonquasistatic model for shortchannel MOSFET's  SAILAJA, Y; PARIKH, CD 
1987  MODELING OF A DEPLETIONMODE MOSFET  PARIKH, CD; VASI, J 
1988  Modeling of a depletionmode mosfet  response  PARIKH, CD; VASI, J 
2002  Modeling of the CoolMOSTM transistor  Part I: device physics  PATIL, MB; DANIEL, BJ; PARIKH, CD 
2002  Modeling of the CoolMOSTM transistor  Part II: DC model and parameter extraction  PATIL, MB; DANIEL, BJ; PARIKH, CD 
1999  A new "multifrequency" charge pumping technique to profile hotcarrierinduced interfacestate density in nMOSFET's  MAHAPATRA, S; PARIKH, CD; VASI, J 
1999  A new “multifrequency” charge pumping technique to profile hotcarrierinduced interfacestate density in nMOSFET's  MAHAPATRA, S; PARIKH, CD; VASI, J 
1998  A new quasistatic model for shortchannel MOSFETs  DAMLE, P; PARIKH, CD 
1998  A new technique to profile hotcarrier induced interface state generation in nMOSFETs using charge pumping  MAHAPATRA, S; PARIKH, CD; VASI, J 
2001  Performance and hotcarrier reliability of 100 nm channel length jet vapor deposited Si3N4 MNSFETs  MAHAPATRA, S; RAMGOPAL RAO, V; CHENG, B; KHARE, M; PARIKH, CD; WOO, JCS; VASI, J 
1996  RADSPICE: A circuit simulator to predict the effects of radiation  CHUMBER, HK; KALAVADE, PP; PARIKH, CD; DAS, A 
Showing results 2 to 21 of 22
