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Issue DateTitleAuthor(s)
2008On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO(2)/SiO(2) gate stackMAJI, D; CRUPI, F; GIUSI, G; PACE, C; SIMOEN, E; CLAEYS, C; RAO, VR
2009Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETsMAJI, D; CRUPI, F; AMAT, E; SIMOEN, E; DE JAEGER, B; BRUNCO, DP; MANOJ, CR; RAO, VR; MAGNONE, P; GIUSI, G; PACE, C; PANTISANO, L; MITARD, J; RODRIGUEZ, R; NAFRIA, M
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