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Issue Date	Title	Author(s)
2008	Nitride engineering and the effect of interfaces on charge trap flash performance and reliability	SANDHYA, C; GANGULY, U; SINGH, KK; SINGH, PK; OLSEN, C; SEUTTER, SM; HUNG, R; CONTI, G; AHMED, K; KRISHNA, N; VASI, J; MAHAPATRA, S
2010	Study of P/E Cycling Endurance Induced Degradation in SANOS Memories Under NAND (FN/FN) Operation	SANDHYA, C; OAK, AB; CHATTAR, N; GANGULY, U; OLSEN, C; SEUTTER, SM; DATE, L; HUNG, R; VASI, J; MAHAPATRA, S

Showing results 12 to 13 of 13