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Issue DateTitleAuthor(s)
2003The effect of CHE and CHISEL programming operation on drain disturb in flash EEPROMsNAIR, DR; MOHAPATRA, NR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2004Effect of P/E cycling on drain disturb in flash EEPROMs under CHE and CHISEL operationMAHAPATRA, S; NAIR, DR; MOHAPATRA, NR; SHUKURI, S; BUDE, JD
2005Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operationMAHAPATRA, S; NAIR, DR; SHUKURI, S; BUDE, JD
2005Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operationNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2003The impact of channel engineering on the performance reliability and scaling of CHISEL NOR flash EEPROMsMOHAPATRA, NR; NAIR, DR; MAHAPATRA, S; RAMGOPAL RAO, V; SHUKURI, S
2005Mechanism of drain disturb in SONOS flash EEPROMsBHARATH KUMAR, P; SHARMA, RAVINDER; NAIR, PR; NAIR, DR; KAMOHARA, S; MAHAPATRA, S; VASI, J
2004Multi-level programming of NOR flash EEPROMs by CHISEL mechanismNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2005Soft secondary electron programming for floating gate NOR flash EEPROMsBHARATH KUMAR, P; NAIR, DR; MAHAPATRA, S
2006Using soft secondary electron programming to reduce drain disturb in floating-gate nor flash EEPROMsMAHAPATRA, S; BHARATH KUMAR, P; NAIR, DR
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