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Issue Date	Title	Author(s)
2002	The study of damage generation in n-channel MOS transistors operating in the substrate enhanced gate current regime	MOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V
2001	Study of degradation in channel initiated secondary electron injection regime	MOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V
2001	Sub-100 nm CMOS circuit performance with high-K gate dielectrics	MOHAPATRA, NR; DUTTA, A; SRIDHAR, G; DESAI, MP; RAO, VR

Showing results 16 to 18 of 18