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Browsing by Author MANJULARANI, KN

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Issue DateTitleAuthor(s)
2002Polarity dependence of degradation in ultra thin oxide and JVD nitride gate dielectricsMUTHA, Y; MANJULARANI, KN; LAL, R; RAO, VR
2000ULSI MOS transistors with jet vapour deposited (JVD) silicon nitride for the gate insulatorMAHAPATRA, S; MANJULARANI, KN; RAO, VR; VASI, J
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