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Issue Date	Title	Author(s)
2002	Polarity dependence of degradation in ultra thin oxide and JVD nitride gate dielectrics	MUTHA, Y; MANJULARANI, KN; LAL, R; RAO, VR
2000	ULSI MOS transistors with jet vapour deposited (JVD) silicon nitride for the gate insulator	MAHAPATRA, S; MANJULARANI, KN; RAO, VR; VASI, J

Showing results 3 to 4 of 4