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Browsing by Author MAHAPATRA, S

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Issue DateTitleAuthor(s)
2009Recent advances in charge trap flash memoriesSANDHYA, C; SINGH, PK; GUPTA, S; ROHRA, H; SHIVATHEJA, M; GANGULY, U; HOFMANN, R; MUKHOPADHYAY, G; MAHAPATRA, S; VASI, J
2007Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects, and relaxationISLAM, AE; KUFLUOGLU, H; VARGHESE, D; MAHAPATRA, S; ALAM, MA
2009Reliability of single and dual layer Pt Nanocrystal devices for NAND flash applications : a 2-region model for endurance defect generationSINGH, PK; BISHT, G; SIVATHEJA, M; SANDHYA, C; MUKHOPADHYAY, G; MAHAPATRA, S; HOFMANN, R; SINGH, K; KRISHNA, N
2000Reliability studies on sub 100 nm SOI-MNSFETsMAHAPATRA, S; RAMGOPAL RAO, V; VASI, J; CHENG, B; WOO, JCS
2006Role of anode hole injection and valence band hole tunneling on interface trap generation during hot carrier injection stressMAHAPATRA, S; SAHA, D; VARGHESE, D
2000Role of inversion layer quantization on sub-bandgap impact ionization in deep-sub-micron n-channel MOSFETsANIL, KG; MAHAPATRA, S; EISELE, I
1992S-BAND MEDIUM-POWER MESFET AMPLIFIER WITH HIGH-STABILITYSAMUEL, M; NAWARANGE, A; MAHAPATRA, S
1991Selective electroless plating-a new technique for GaAs MMICsMAHAPATRA, S; CHOUDHURY, D; BHATGADDE, LG
2005Soft secondary electron programming for floating gate NOR flash EEPROMsBHARATH KUMAR, P; NAIR, DR; MAHAPATRA, S
1979STABILIZATION OF SENSITIZER USED IN THE ELECTROLESS DEPOSITION OF COPPER ON CERAMIC MATERIALSBHATGADDE, LG; MAHAPATRA, S
1999A study of 100 nm channel length asymmetric channel MOSFET by using charge pumpingMAHAPATRA, S; RAO, VR; PARIKH, CD; VASI, J; CHENG, B; WOO, JCS
2011Study of automatic recovery on the metal nanocrystal-based Al(2)O(3)/SiO(2) gate stackCHEN, YN; PEY, KL; GOH, KEJ; LWIN, ZZ; SINGH, P; MAHAPATRA, S
2002The study of damage generation in n-channel MOS transistors operating in the substrate enhanced gate current regimeMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V
2001Study of degradation in channel initiated secondary electron injection regimeMOHAPATRA, NR; MAHAPATRA, S; RAMGOPAL RAO, V
2001A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping techniqueMAHAPATRA, S; RAO, VR; VASI, J; CHENG, B; WOO, JCS
2008A study of NBTI in HfSiON/TiN p-MOSFETs using ultra-fast on-the-fly (UF-OTF) I(DLIN) techniqueDEORA, S; MAHAPATRA, S
2010Study of P/E Cycling Endurance Induced Degradation in SANOS Memories Under NAND (FN/FN) OperationSANDHYA, C; OAK, AB; CHATTAR, N; GANGULY, U; OLSEN, C; SEUTTER, SM; DATE, L; HUNG, R; VASI, J; MAHAPATRA, S
2003Substrate bias effect on cycling induced performance degradation of flash EEPROMsMAHAPATRA, S; SHUKURI, S; BUDE, JD
1986SWITCHED REFLECTION PHASE-SHIFTERKORI, MH; MAHAPATRA, S
1976Temperature profile inside active layer of a gunn diodeJANADHANAN, P; MAHAPATRA, S
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