|
|
DSpace at IIT Bombay >
Browsing by Author MAHAPATRA, S
Showing results 82 to 101 of 138
| Issue Date | Title | Author(s) | | 2010 | NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and Dispersive hole trapping model | DEORA, S; MAHETA, VD; MAHAPATRA, S |
| 2005 | Negative bias temperature instability in CMOS devices | MAHAPATRA, S; ALAM, AA; KUMAR, PB; DALEI, TR; VARGHESE, D; SAHA, D |
| 1975 | New active rc circuit realization of a 3rd-order low-pass butterworth characteristic using grounded capacitors and equal-valued passive elements | NAIMPALLY, SV; MAHAPATRA, S |
| 1978 | NEW ELECTROLESS METHOD FOR LOW-LOSS MICROWAVE INTEGRATED-CIRCUITS | MAHAPATRA, S; PRASAD, SN |
| 1983 | A new mic slot-line aerial | PRASAD, SN; MAHAPATRA, S |
| 1999 | A new "multifrequency" charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET's | MAHAPATRA, S; PARIKH, CD; VASI, J |
| 1999 | A new “multifrequency” charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET's | MAHAPATRA, S; PARIKH, CD; VASI, J |
| 2003 | A new observation of enhanced bias temperature instability in thin gate oxide p-MOSFETs | MAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA |
| 1998 | A new technique to profile hot-carrier induced interface state generation in nMOSFETs using charge pumping | MAHAPATRA, S; PARIKH, CD; VASI, J |
| 2008 | Nitride engineering and the effect of interfaces on charge trap flash performance and reliability | SANDHYA, C; GANGULY, U; SINGH, KK; SINGH, PK; OLSEN, C; SEUTTER, SM; HUNG, R; CONTI, G; AHMED, K; KRISHNA, N; VASI, J; MAHAPATRA, S |
| 1988 | A novel electroless process of deposition of thin ni-p coatings on poly(methyl) methacrylate | BHATGADDE, LG; MAHAPATRA, S |
| 1983 | A NOVEL ELECTROLESS TECHNIQUE FOR COPPER METALLIZATION OF ALUMINA SUBSTRATES | BHATGADDE, LG; MAHAPATRA, S |
| 2009 | A Novel Gate-Assisted Reverse-Read Scheme to Control Bit Coupling and Read Disturb for Multibit/Cell Operation in Deeply Scaled Split-Gate SONOS Flash EEPROM Cells | DATTA, A; ASNANI, R; MAHAPATRA, S |
| 1990 | A novel method of metallization for MMICs | MAHAPATRA, S; CHOUDHURY, D |
| 1985 | ON THE DESIGN OF HIGH-POWER MULTIPLE-ELEMENT LOADED-LINE PHASE SHIFTERS | NAYAGAM, S; MAHAPATRA, S |
| 2005 | On the dispersive versus arrhenius temperature activation of nbti time evolution in plasma nitrided gate oxides: measurements, theory, and implications | VARGHESE, D; SAHA, D; MAHAPATRA, S; AHMED, K; NOURI, F; ALAM, M |
| 2006 | On the generation and recovery of hot carrier induced interface traps: a critical examination of the 2-D R-D model | MAHAPATRA, S; SAHA, D; VARGHESE, D |
| 2006 | On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress | MAHAPATRA, S; SAHA, D; VARGHESE, D; BHARATH KUMAR, P |
| 2010 | On the Nature of Shunt Leakage in Amorphous Silicon p-i-n Solar Cells | DONGAONKAR, S; KARTHIK, Y; WANG, DP; FREI, M; MAHAPATRA, S; ALAM, MA |
| 2007 | On the physical mechanism of NBTI in silicon oxynitride p-MOSFETs: can differences in insulator processing conditions resolve the interface trap generation versus hole trapping controversy? | MAHAPATRA, S; AHMED, K; VARGHESE, D; ISLAM, AE; GUPTA, G; MADHAV, L; SAHA, D; ALAM, MA |
Showing results 82 to 101 of 138
|
