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DSpace at IIT Bombay >
Browsing by Author MAHAPATRA, S
Showing results 65 to 84 of 138
| Issue Date | Title | Author(s) | | 2006 | Lateral profiling of trapped charge in SONOS flash EEPROMs programmed using CHE injection | MAHAPATRA, S; BHARATH KUMAR, P; NAIR, PR; SHARMA, RAVINDER; KAMOHARA, S |
| 1979 | Least-square collocation as applied to the analysis of strip transmission-lines | SESHADRI, TK; MAHAPATRA, S; RAJAIAH, K |
| 1999 | Low temperature-high pressure grown thin gate dielectrics for MOS applications | RAMGOPAL RAO, V; MAHAPATRA, S; SHARMA, DK; VASI, J; GRABOLLA, T; EISELE, I; HANSCH, W |
| 1995 | Mapping of backpropagation learning onto distributed memory multiprocessors | MAHAPATRA, S; MAHAPATRA, RN |
| 1997 | Mapping of neural network models onto massively parallel hierarchical computer systems | MAHAPATRA, S |
| 2007 | Material dependence of NBTI physical mechanism in silicon oxynitride (SiON) p-MOSFETs: A comprehensive study by ultra-fast on-the-fly (UF-OTF) I(DLIN) technique | KUMAR, EN; MAHETA, VD; PURAWAT, S; ISLAM, AE; OLSEN, C; AHMED, K; ALAM, MA; MAHAPATRA, S |
| 2009 | Material dependence of negative bias temperature instability (NBTI) stress and recovery in SiON p-MOSFETs | MAHAPATRA, S; MAHETA, VD; DEORA, S; KUMAR, EN; PURAWAT, S; OLSEN, C; AHMED, K; ISLAM, AE; ALAM, MA |
| 2005 | Mechanism of drain disturb in SONOS flash EEPROMs | BHARATH KUMAR, P; SHARMA, RAVINDER; NAIR, PR; NAIR, DR; KAMOHARA, S; MAHAPATRA, S; VASI, J |
| 2004 | Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogen | MAHAPATRA, S; BHARATH KUMAR, P; DALEI, TR; SANA, D; ALAM, MA |
| 2008 | Metal nanocrystal memory with pt single- and dual-layer NC With low-Leakage AI2O3 Blocking Dielectric | SINGH, PK; BISHT, G; HOFMANN, R; SINGH, K; KRISHNA, N; MAHAPATRA, S |
| 1980 | MICROSTRIP TRANSMISSION-LINE ANALYSIS BY THE USE OF THE LEAST-SQUARES COLLOCATION METHOD | SESHADRI, TK; MAHAPATRA, S; RAJAIAH, K |
| 1988 | MICROWAVE BEHAVIOR OF ELECTROLESS MICROSTRIP LINES ON SI GAAS SUBSTRATES | SINHA, MP; MAHAPATRA, S |
| 2008 | Mobility degradation due to interface traps in plasma oxynitride PMOS devices | ISLAM, AE; MAHETA, VD; DAS, H; MAHAPATRA, S; ALAM, MA |
| 1977 | MODIFIED ELECTROLESS METHOD FOR FABRICATION OF MICROSTRIP LINES ON ALUMINA SUBSTRATES | SESHADRI, TK; MAHAPATRA, S |
| 2001 | Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs | KUMAR, A; MAHAPATRA, S; LAL, R; RAO, VR |
| 1992 | MULTILAYERED DIELECTRIC STRIPLINE | PATIL, KD; MAITI, SK; MAHAPATRA, S |
| 2004 | Multi-level programming of NOR flash EEPROMs by CHISEL mechanism | NAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD |
| 2010 | NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and Dispersive hole trapping model | DEORA, S; MAHETA, VD; MAHAPATRA, S |
| 2005 | Negative bias temperature instability in CMOS devices | MAHAPATRA, S; ALAM, AA; KUMAR, PB; DALEI, TR; VARGHESE, D; SAHA, D |
| 1975 | New active rc circuit realization of a 3rd-order low-pass butterworth characteristic using grounded capacitors and equal-valued passive elements | NAIMPALLY, SV; MAHAPATRA, S |
Showing results 65 to 84 of 138
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