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DSpace at IIT Bombay >
Browsing by Author MAHAPATRA, S
Showing results 6 to 25 of 138
| Issue Date | Title | Author(s) | | 2002 | CHISEL flash EEPROM - Part II: Reliability | MAHAPATRA, S; SHUKURI, S; BUDE, J |
| 2002 | CHISEL flash EEPROM - Part I: Performance and scaling | MAHAPATRA, S; SHUKURI, S; BUDE, J |
| 2003 | CHISEL programming operation of scaled NOR flash EEPROMs - Effect of voltage scaling, device scaling and technological parameters | MOHAPATRA, NR; NAIR, DR; MAHAPATRA, S; RAO, VR; SHUKURI, S; BUDE, JD |
| 2003 | CHISEL programming operation of scaled NOR flash EEPROMs-effect of voltage scaling, device scaling and technological parameters | MAHAPATRA, S; MOHAPATRA, NR; NAIR, DR; RAMGOPAL RAO, V; SHUKURI, S; BUDE, JD |
| 2009 | Click' Chemistry on Sugar-Derived Alkynes: A Tandem 'Click-Click' Approach to Bistriazoles | KALIAPPAN, KP; KALANIDHI, P; MAHAPATRA, S |
| 2009 | A Common Framework of NBTI Generation and Recovery in Plasma-Nitrided SiON p-MOSFETs | DEORA, S; MAHETA, VD; ISLAM, AE; ALAM, MA; MAHAPATRA, S |
| 2009 | A Comparative NBTI Study of HfO(2), HfSiO(x), and SiON p-MOSFETs Using UF-OTF I(DLIN) Technique | DEORA, S; MAHETA, VD; BERSUKER, G; OLSEN, C; AHMED, KZ; JAMMY, R; MAHAPATRA, S |
| 2002 | A comparative study of scaling properties of MOS transistors in CHE and CHISEL injection regime | MOHAPATRA, NR; MAHAPATRA, S; RAO, VR |
| 2001 | Comparison of sub-bandgap impact ionization in sub-100 nm conventional and lateral asymmetrical channel nMOSFETs | ANIL, K; MAHAPATRA, S; RAO, VR; EISELE, I |
| 2010 | A comprehensive analysis on scaling prospects of dual-bit channel engineered SONOS NOR-flash EEPROM cells | DATTA, A; MAHAPATRA, S |
| 2007 | A comprehensive model for PMOS NBTI degradation: Recent progress | ALAM, MA; KUFLUOGLU, H; VARGHESE, D; MAHAPATRA, S |
| 2005 | A comprehensive model of PMOS NBTI degradation | ALAM, MA; MAHAPATRA, S |
| 2006 | Comprehensive simulation of program, erase and retention in charge tapping flash memories | PAUL, A; CHSRIDHAR; GEDAM, S; MAHAPATRA, S |
| 2008 | A comprehensive study of flicker noise in plasma nitrided SiON p-MOSFETs : process dependence of pre-existing and NBTI stress generated trap distribution profiles | KAPILA, G; GOYAL, N; MAHETA, VD; OLSEN, C; AHMED, K; MAHAPATRA, S |
| 2000 | A comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique | MAHAPATRA, S; PARIKH, CD; RAMGOPAL RAO, V; VISWANATHAN, CR; VASI, J |
| 2004 | A comprehensive trapped charge profiling technique for SONOS flash EEPROMs | NAIR, PR; BHARATH KUMAR, P; SHARMA, RAVINDER; MAHAPATRA, S; KAMOHARA, S |
| 2005 | Controlling injected electron and hole profiles for better reliability of split gate SONOS | SRIDHAR, K; BHARATH KUMAR, P; MAHAPATRA, S; MURAKAMI, E; KAMOHARA, S |
| 1980 | CORNER FUNCTION-ANALYSIS OF MICROSTRIP TRANSMISSION-LINES | SESHADRI, TK; MAHAPATRA, S; RAJAIAH, K |
| 2004 | Cycling endurance of NOR flash EEPROM cells under CHISEL programming operation - impact of technological parameters and scaling | NAIR, DR; SHUKURI, S; MAHAPATRA, S |
| 2008 | Defect generation in p-MOSFETs under negative-bias stress: an experimental perspective | MAHAPATRA, S; ALAM, MA |
Showing results 6 to 25 of 138
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