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Browsing by Author MAHAPATRA, S

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Issue DateTitleAuthor(s)
2004Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogenMAHAPATRA, S; BHARATH KUMAR, P; DALEI, TR; SANA, D; ALAM, MA
2008Metal nanocrystal memory with pt single- and dual-layer NC With low-Leakage AI2O3 Blocking DielectricSINGH, PK; BISHT, G; HOFMANN, R; SINGH, K; KRISHNA, N; MAHAPATRA, S
1980MICROSTRIP TRANSMISSION-LINE ANALYSIS BY THE USE OF THE LEAST-SQUARES COLLOCATION METHODSESHADRI, TK; MAHAPATRA, S; RAJAIAH, K
1988MICROWAVE BEHAVIOR OF ELECTROLESS MICROSTRIP LINES ON SI GAAS SUBSTRATESSINHA, MP; MAHAPATRA, S
2008Mobility degradation due to interface traps in plasma oxynitride PMOS devicesISLAM, AE; MAHETA, VD; DAS, H; MAHAPATRA, S; ALAM, MA
1977MODIFIED ELECTROLESS METHOD FOR FABRICATION OF MICROSTRIP LINES ON ALUMINA SUBSTRATESSESHADRI, TK; MAHAPATRA, S
2001Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETsKUMAR, A; MAHAPATRA, S; LAL, R; RAO, VR
1992MULTILAYERED DIELECTRIC STRIPLINEPATIL, KD; MAITI, SK; MAHAPATRA, S
2004Multi-level programming of NOR flash EEPROMs by CHISEL mechanismNAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD
2010NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and Dispersive hole trapping modelDEORA, S; MAHETA, VD; MAHAPATRA, S
2005Negative bias temperature instability in CMOS devicesMAHAPATRA, S; ALAM, AA; KUMAR, PB; DALEI, TR; VARGHESE, D; SAHA, D
1975New active rc circuit realization of a 3rd-order low-pass butterworth characteristic using grounded capacitors and equal-valued passive elementsNAIMPALLY, SV; MAHAPATRA, S
1978NEW ELECTROLESS METHOD FOR LOW-LOSS MICROWAVE INTEGRATED-CIRCUITSMAHAPATRA, S; PRASAD, SN
1983A new mic slot-line aerialPRASAD, SN; MAHAPATRA, S
1999A new "multifrequency" charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET'sMAHAPATRA, S; PARIKH, CD; VASI, J
1999A new “multifrequency” charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET'sMAHAPATRA, S; PARIKH, CD; VASI, J
2003A new observation of enhanced bias temperature instability in thin gate oxide p-MOSFETsMAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA
1998A new technique to profile hot-carrier induced interface state generation in nMOSFETs using charge pumpingMAHAPATRA, S; PARIKH, CD; VASI, J
2008Nitride engineering and the effect of interfaces on charge trap flash performance and reliabilitySANDHYA, C; GANGULY, U; SINGH, KK; SINGH, PK; OLSEN, C; SEUTTER, SM; HUNG, R; CONTI, G; AHMED, K; KRISHNA, N; VASI, J; MAHAPATRA, S
1988A novel electroless process of deposition of thin ni-p coatings on poly(methyl) methacrylateBHATGADDE, LG; MAHAPATRA, S
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