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DSpace at IIT Bombay >
Browsing by Author MAHAPATRA, S
Showing results 73 to 92 of 138
| Issue Date | Title | Author(s) | | 2004 | Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogen | MAHAPATRA, S; BHARATH KUMAR, P; DALEI, TR; SANA, D; ALAM, MA |
| 2008 | Metal nanocrystal memory with pt single- and dual-layer NC With low-Leakage AI2O3 Blocking Dielectric | SINGH, PK; BISHT, G; HOFMANN, R; SINGH, K; KRISHNA, N; MAHAPATRA, S |
| 1980 | MICROSTRIP TRANSMISSION-LINE ANALYSIS BY THE USE OF THE LEAST-SQUARES COLLOCATION METHOD | SESHADRI, TK; MAHAPATRA, S; RAJAIAH, K |
| 1988 | MICROWAVE BEHAVIOR OF ELECTROLESS MICROSTRIP LINES ON SI GAAS SUBSTRATES | SINHA, MP; MAHAPATRA, S |
| 2008 | Mobility degradation due to interface traps in plasma oxynitride PMOS devices | ISLAM, AE; MAHETA, VD; DAS, H; MAHAPATRA, S; ALAM, MA |
| 1977 | MODIFIED ELECTROLESS METHOD FOR FABRICATION OF MICROSTRIP LINES ON ALUMINA SUBSTRATES | SESHADRI, TK; MAHAPATRA, S |
| 2001 | Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs | KUMAR, A; MAHAPATRA, S; LAL, R; RAO, VR |
| 1992 | MULTILAYERED DIELECTRIC STRIPLINE | PATIL, KD; MAITI, SK; MAHAPATRA, S |
| 2004 | Multi-level programming of NOR flash EEPROMs by CHISEL mechanism | NAIR, DR; MAHAPATRA, S; SHUKURI, S; BUDE, JD |
| 2010 | NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and Dispersive hole trapping model | DEORA, S; MAHETA, VD; MAHAPATRA, S |
| 2005 | Negative bias temperature instability in CMOS devices | MAHAPATRA, S; ALAM, AA; KUMAR, PB; DALEI, TR; VARGHESE, D; SAHA, D |
| 1975 | New active rc circuit realization of a 3rd-order low-pass butterworth characteristic using grounded capacitors and equal-valued passive elements | NAIMPALLY, SV; MAHAPATRA, S |
| 1978 | NEW ELECTROLESS METHOD FOR LOW-LOSS MICROWAVE INTEGRATED-CIRCUITS | MAHAPATRA, S; PRASAD, SN |
| 1983 | A new mic slot-line aerial | PRASAD, SN; MAHAPATRA, S |
| 1999 | A new "multifrequency" charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET's | MAHAPATRA, S; PARIKH, CD; VASI, J |
| 1999 | A new “multifrequency” charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET's | MAHAPATRA, S; PARIKH, CD; VASI, J |
| 2003 | A new observation of enhanced bias temperature instability in thin gate oxide p-MOSFETs | MAHAPATRA, S; BHARATH KUMAR, P; ALAM, MA |
| 1998 | A new technique to profile hot-carrier induced interface state generation in nMOSFETs using charge pumping | MAHAPATRA, S; PARIKH, CD; VASI, J |
| 2008 | Nitride engineering and the effect of interfaces on charge trap flash performance and reliability | SANDHYA, C; GANGULY, U; SINGH, KK; SINGH, PK; OLSEN, C; SEUTTER, SM; HUNG, R; CONTI, G; AHMED, K; KRISHNA, N; VASI, J; MAHAPATRA, S |
| 1988 | A novel electroless process of deposition of thin ni-p coatings on poly(methyl) methacrylate | BHATGADDE, LG; MAHAPATRA, S |
Showing results 73 to 92 of 138
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