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Issue DateTitleAuthor(s)
1986SHUNT RESISTANCE AND SOFT REVERSE CHARACTERISTICS OF SILICON DIFFUSED-JUNCTION SOLAR-CELLSLAL, R; SHARAN, R
1992SIMPAC-T - a simulator for multitransputer systemsARUNKUMAR, S; LAL, R; VENKATAGOPAL, R
2001A simple and direct technique for interface characterization of SOI MOSFETs and its application in hot carrier degradation studies in sub-100 nm JVD MNSFETsKUMAR, A; LAL, R; RAO, VR
1992STACKING-FAULTS UNDER REOXIDIZED NITRIDED OXIDESKOLACHINA, SK; LAL, R
1992STRUCTURAL AND ELECTRICAL-PROPERTIES OF CADMIUM-OXIDE FILMS DEPOSITED BY THE ACTIVATED REACTIVE EVAPORATION TECHNIQUEPHATAK, G; LAL, R
1997A study of Langmuir and Langmuir-Blodgett films of polyanilineDHANABALAN, A; DABKE, RB; KUMAR, NP; TALWAR, SS; MAJOR, S; LAL, R; CONTRACTOR, AQ
1992STUDY OF PROTON BINDING-SITES AT THE SILICON DIOXIDE-ELECTROLYTE INTERFACE WITH CONDUCTANCE SPECTROSCOPYMITRA, M; LAL, R
2007Time response and stability of porous silicon capacitive immunosensorsBETTY, CA; LAL, R; YAKHMI, JV; KULSHRESHTHA, SK
1988TRANSITION BETWEEN TETRAGONAL AND RHOMBOHEDRAL PHASES OF PZT CERAMICS PREPARED FROM SPRAY-DRIED POWDERSLAL, R; KRISHNAN, R; RAMAKRISHNAN, P
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