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Browsing by Author LAL, R

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Issue DateTitleAuthor(s)
1993DEGRADATION OF OXIDES IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS UNDER HIGH-FIELD STRESSPATRIKAR, RM; LAL, R; VASI, J
1994DEPOSITION AND PROPERTIES OF CADMIUM-OXIDE FILMS BY ACTIVATED REACTIVE EVAPORATIONPHATAK, G; LAL, R
1993EFFECT OF ELECTROLYTE EXPOSURE ON SILICON DIOXIDE IN ELECTROLYTE OXIDE SEMICONDUCTOR STRUCTURESTOPKAR, A; LAL, R
1989EFFECT OF SINTERING PARAMETERS ON THE MICROSTRUCTURE AND PROPERTIES OF STRONTIUM MODIFIED PZT CERAMICS PREPARED USING SPRAY-DRIED POWDERSLAL, R; GOKHALE, NM; KRISHNAN, R; RAMAKRISHNAN, P
1991ELECTRICAL-PROPERTIES OF SILICON DIOXIDE FILMS GROWN BY INDUCTIVELY COUPLED RF PLASMA ANODIZATIONCHOKSI, AJ; LAL, R; CHANDORKAR, AN
2006Facile fabrication of microfluidic systems using electron beam lithographyMALI, P; SARKAR, A; LAL, R
1989FIELD ACCELERATION FACTOR FOR DIELECTRIC-BREAKDOWN OF MOS DEVICESPATRIKAR, RM; LAL, R
1992GROWTH-KINETICS OF SILICON DIOXIDE ON SILICON IN AN INDUCTIVELY COUPLED RF PLASMA AT CONSTANT ANODIZATION CURRENTSCHOKSI, AJ; LAL, R; CHANDORKAR, AN
1993HIGH-FIELD CHARACTERISTICS OF METAL-OXIDE-SEMICONDUCTOR CAPACITORS WITH THE SILICON IN INVERSIONPATRIKAR, RM; LAL, R; VASI, J
2009Impedance model of electrolyte-insulator-semiconductor structure with porous silicon semiconductorBETTY, CA; LAL, R; YAKHMI, JV
1992Improved electrical-properties of Silicon dioxide films for MOS gate dielectrics grown in an inductively coupled RF plasmaCHOKSI, AJ; LAL, R; CHANDORKAR, AN
1992Integrated biosensors - promises and problemsLAL, R
1995INTERFACE STATE GENERATION DUE TO HIGH-FIELD STRESSING IN MOS OXIDESPATRIKAR, RM; LAL, R; VASI, J
2007Investigations of enhanced device characteristics in pentacene-based field effect transistors with sol-gel interfacial layerCAHYADI, T; TEY, JN; MHAISALKAR, SG; BOEY, F; RAO, VR; LAL, R; HUANG, ZH; QI, GJ; CHEN, ZK; NG, CM
1997An ion-activated molecular electronic deviceDABKE, RB; SINGH, GD; DHANABALAN, A; LAL, R; CONTRACTOR, AQ
1995IONIC PENETRATION INTO REOXIDIZED NITRIDED OXIDES IN ELECTROLYTE-OXIDE-SEMICONDUCTOR STRUCTURESTOPKAR, A; LAL, R
2000Ionizing-radiation induced degradation of SiGeHBTsTOPKAR, A; LODHA, S; MAHFOOZ, AT; VASI, J; LAL, R; NANVER, L
1996Low-cost RF spectrum analyserRAO, MS; GOVINDARAJAN, M; LAL, R
1998Low dose radiation sensor for medical therapy applicationsANIL, KG; VASI, J; LAL, R
2004A low voltage single cell electroporator with a microfabricated sense-porate apertureSARKAR, A; MITRA, B; SHASTRY, A; WADIA, S; MULHERKA, R; LAL, R
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