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Issue Date	Title	Author(s)
2007	A comprehensive model for PMOS NBTI degradation: Recent progress	ALAM, MA; KUFLUOGLU, H; VARGHESE, D; MAHAPATRA, S
2007	Recent issues in negative-bias temperature instability: Initial degradation, field dependence of interface trap generation, hole trapping effects, and relaxation	ISLAM, AE; KUFLUOGLU, H; VARGHESE, D; MAHAPATRA, S; ALAM, MA

Showing results 1 to 2 of 2