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Issue Date	Title	Author(s)
2001	Performance and hot-carrier reliability of 100 nm channel length jet vapor deposited Si3N4 MNSFETs	MAHAPATRA, S; RAMGOPAL RAO, V; CHENG, B; KHARE, M; PARIKH, CD; WOO, JCS; VASI, J
1996	Simulation of radiation effects in MOSFETs	EKBOTE, S; TAMBE, D; ZAMAN, P; DANGAT, HK; KHARE, M; SINHA, P; RODD, S; BUKHANWALA, N; VASI, J; SHARMA, DK; DAS, A

Showing results 3 to 4 of 4