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Issue DateTitleAuthor(s)
2005NBTI degradation and its impact for analog circuit reliabilityRAMGOPAL RAO, V; JHA, NEERAJ K; REDDY, PS; SHARMA, DK
2005A new drain voltage enhanced NBTI degradation mechanismJHA, NEERAJ K; REDDY, PS; RAMGOPAL RAO, V
2002Optimization and realization of sub-100-nm channel length single halo p-MOSFETsRAMGOPAL RAO, V; BORSE, DG; MANJULA RANI, KN; JHA, NEERAJ K; CHANDORKAR, AN; VASI, J; CHENG, B; WOO, JCS
Showing results 1 to 3 of 3


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