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Issue DateTitleAuthor(s)
2010NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and Dispersive hole trapping modelDEORA, S; MAHETA, VD; MAHAPATRA, S
2008A study of NBTI in HfSiON/TiN p-MOSFETs using ultra-fast on-the-fly (UF-OTF) I(DLIN) techniqueDEORA, S; MAHAPATRA, S
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