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Browsing by Author DEORA, S
Showing results 3 to 5 of 5
| Issue Date | Title | Author(s) | | 2009 | Material dependence of negative bias temperature instability (NBTI) stress and recovery in SiON p-MOSFETs | MAHAPATRA, S; MAHETA, VD; DEORA, S; KUMAR, EN; PURAWAT, S; OLSEN, C; AHMED, K; ISLAM, AE; ALAM, MA |
| 2010 | NBTI lifetime prediction in SiON p-MOSFETs by H/H2 Reaction-Diffusion(RD) and Dispersive hole trapping model | DEORA, S; MAHETA, VD; MAHAPATRA, S |
| 2008 | A study of NBTI in HfSiON/TiN p-MOSFETs using ultra-fast on-the-fly (UF-OTF) I(DLIN) technique | DEORA, S; MAHAPATRA, S |
Showing results 3 to 5 of 5
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