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Browsing by Author CHANDORKAR, AN

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Issue DateTitleAuthor(s)
1991PROCESS DEPENDENCE OF BREAKDOWN FIELD IN THERMALLY NITRIDED SILICON DIOXIDERAMESH, K; CHANDORKAR, AN; VASI, J
1992RESPONSE STUDY OF ELECTRON-BEAM EVAPORATED THIN-FILM TIN OXIDE GAS SENSORSREDDY, MHM; CHANDORKAR, AN
2007Response surface methodology for statistical characterization of nano CMOS devices and circuitsMANDE, S; CHANDORKAR, AN
1991Role of electron traps in the radiation hardness of thermally nitrided silicon dioxideCHANDORKAR, AN; RAMESH, K; AGARWAL, A; VASI, J
2003Spectroscopy of silicon dioxide films grown under negative corona stressPRASAD, I; CHANDORKAR, AN
1993A study of radiation effects on reoxidized nitrided-oxide mosfets, including effects on mobilityMALLIK, A; VASI, J; CHANDORKAR, AN
2002Study of SILC and interface trap generation due to high field stressing and its operating temperature dependence in 2.2 nm gate dielectricsCHANDORKAR, AN; BORSE, DG; VAIDYA, SJ
2002Study of Ta2O5 based MOS capacitors, with tantalum oxidized in O-2 : NH3 ambientKRISHNAMOORTHI, P; CHANDORKAR, AN
1995THEORY OF HOPPING TRANSPORT OF HOLES IN AMORPHOUS SIO2DEB, BM; CHANDORKAR, AN
1995VLSI implementation of artificial neural network based digital multiplier and adderRANADE, R; BHANDARI, S; CHANDORKAR, AN
1996VLSI implementation of artificial neural network based digital multiplier and adderRANADE, RANJEET; BHANDARI, SANJAY; CHANDORKAR, AN
2013Voltage and current stress induced variations in TiN/HfSixOy/TiN MIM capacitorsMISRA, D; KASINATH, J; CHANDORKAR, AN
2013Watermarking Hardware Based on Wavelet Coefficients Quantization MethodDARJI, AD; LAD, TC; MERCHANT, SN; CHANDORKAR, AN
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