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Browsing by Author CHANDORKAR, AN

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Issue DateTitleAuthor(s)
1999E-beam deposited SnO2Pt-SnO2 and Pd-SnO2 thin films for LPG detectionREDDY, MHM; CHANDORKAR, AN
1993EFFECT OF ANNEALING ON THE SURFACE AND INTERFACE PROPERTIES OF INDIUM OXIDE SILICON STRUCTURESKOLLURI, SV; CHANDORKAR, AN
1989THE EFFECT OF HEAT-TREATMENT ON THE STRUCTURAL-PROPERTIES OF ELECTRON-BEAM-EVAPORATED SNO2 FILMSREDDY, MHM; JAWALEKAR, SR; CHANDORKAR, AN
1991ELECTRICAL-PROPERTIES OF SILICON DIOXIDE FILMS GROWN BY INDUCTIVELY COUPLED RF PLASMA ANODIZATIONCHOKSI, AJ; LAL, R; CHANDORKAR, AN
1989ELECTRON TRAPPING AND DETRAPPING IN THERMALLY NITRIDED SILICON DIOXIDERAMESH, K; CHANDORKAR, AN; VASI, J
1993Electron trapping during irradiation in reoxidized nitrided oxideCHANDORKAR, AN; MALLIK, A; VASI, J
2008Estimation of process variation impact on DG-FinFET device performance using Plackett-Burman design of experiment methodCHANDORKAR, AN; MANDE, SUDHAKAR; IWAI, HIROSHI
1997Formation and growth of porous siliconVADJIKAR, RM; NATH, AK; CHANDORKAR, AN
2002Growth and study of high-k Ta2O5 films deposited by Ta sputtering followed by its thermal oxidationKRISHNAMOORTHI, P; CHANDORKAR, AN
1992GROWTH-KINETICS OF SILICON DIOXIDE ON SILICON IN AN INDUCTIVELY COUPLED RF PLASMA AT CONSTANT ANODIZATION CURRENTSCHOKSI, AJ; LAL, R; CHANDORKAR, AN
1992Improved electrical-properties of Silicon dioxide films for MOS gate dielectrics grown in an inductively coupled RF plasmaCHOKSI, AJ; LAL, R; CHANDORKAR, AN
1993Indium doping of silicon using an evaporated indium film sourceKOLLURI, SV; CHANDORKAR, AN; DHAUL, A
1989An interface reaction-mechanism for the dry oxidation of siliconMOHARIR, SS; CHANDORKAR, AN; VASI, J
2000Low temperature hot-wire CVD nitrides for deep sub-micron CMOS technologiesPATIL, SB; VAIDYA, S; KUMBHAR, A; DUSANE, RO; CHANDORKAR, AN; RAO, VR
1994MORPHOLOGY OF SELF-SUPPORTING POROUS SILICON LAYERSVADJIKAR, RM; NANDEDKAR, RV; BHAWALKAR, DD; VENKETACHALAM, S; DUSSANI, A; CHANDORKAR, AN
1993THE NATURE OF THE HOLE TRAPS IN REOXIDIZED NITRIDED-OXIDE GATE DIELECTRICSMALLIK, A; VASI, J; CHANDORKAR, AN
2002Neutron induced degradation in nitrided pyrogenic field oxide MOS capacitorsVAIDYA, SJ; SHARMA, DK; SHAIKH, AM; CHANDORKAR, AN
2002Neutron induced ionization damage in MOS capacitor and MOSFET structuresVAIDYA, SJ; SHARMA, DK; CHANDORKAR, AN
2003Neutron induced oxide degradation in MOSFET structuresSHARMA, DK; CHANDORKAR, AN; VAIDYA, SJ
2009A Novel Approach to Link Process Parameters to BSIM Model ParametersMANDE, S; CHANDORKAR, AN; HSAIO, C; HUANG, K; SHEU, YM; LIU, S
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