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Issue Date	Title	Author(s)
2010	Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs	CHABUKSWAR, S; MAJI, D; MANOJ, CR; ANIL, KG; RAO, VR; CRUPI, F; MAGNONE, P; GIUSI, G; PACE, C; COLLAERT, N

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